PPLN Λ = 6.82 µm · 1064 → 532 nm · 2 px/µm

8.3 Wafer size and lane rate

L1 Bigger wafers, faster lanes

12 wafer milestones, 8 lane-rate milestones

Larger wafers carry more chips per process step; thin-film wafers (LNOI) are made by ion slicing and bonding. Between 2023 and 2026, 6- and 8-inch thin-film LN lines were announced in China, Europe, and Taiwan, two of them inside merchant silicon foundries (UMC/Wavetek T/C, X-FAB F). By 2026, vendors stated 200 Gb/s-per-lane TFLN products available and 400 Gb/s per lane sampling V.

Wafer outlines to scale, 1 unit = 1 mm12-inch dashed: LG
Product
3"4"6"8"12"111411156911235789101112
#DateSizeMilestoneGrade
12020-084" and 6"Wafer-scale TFLN PICs, 0.27 dB/cm, DUV lithographyreported
22023-098"Anpai 8-inch TFLN line completed (reporter claim)T
32024-038"Jiufengshan Lab: first 8-inch Si-photonic TFLN wafer (reporter claim)T
420254"4-inch TFLN on quartz, > 110 GHz, VπL 2.92 V cm, 50% yieldreported
52025-066" / 8"Soitec 150 mm LNOI to CCRAFT; 200 mm shownT
62025-06-096"CHIPX first 6-inch TFLN waferT
72026-01-19200 mmLigentec + X-FAB TFLN-on-SiN / SOIF
82026-03200 mmTFLN modulators on 200 mm Si in a BEOL CMOS foundry; 1.87 V cm best on wafer map; chip bandwidth 93-110 GHz (OFC 2026 W1A.3)reported
92026-036" / 8"HyperLight + UMC / Wavetek volume productionT/C
102026-06-038" bulk LNTDG Holding states 8-inch LN in mass productionF
11undated3"-8"NanoLN lists LNOI and LTOI at 3, 4, 6, 8 inchF
12undated12"12-inch optical-grade LN wafer "prepared" (TDG, secondary, unsourced)LG
Milestone numbers match the table; marks dim with the product filter. Dies per wafer: next figure.
Product
3" 76.2 mm
milestones: 1
4" 100 mm
milestones: 3
6" 150 mm
milestones: 5
8" 200 mm
milestones: 8
12" 300 mm
milestones: 1, LG only
  1. 2020-084" and 6" · thin filmWafer-scale TFLN PICs, 0.27 dB/cm, DUV lithographyreported
  2. 2023-098" · thin filmAnpai 8-inch TFLN line completed (reporter claim)T
  3. 2024-038" · thin filmJiufengshan Lab: first 8-inch Si-photonic TFLN wafer (reporter claim)T
  4. 20254" · thin film4-inch TFLN on quartz, > 110 GHz, VπL 2.92 V cm, 50% yieldreported
  5. 2025-066" / 8" · thin filmSoitec 150 mm LNOI to CCRAFT; 200 mm shownT
  6. 2025-06-096" · thin filmCHIPX first 6-inch TFLN waferT
  7. 2026-01-19200 mm · thin filmLigentec + X-FAB TFLN-on-SiN / SOIF
  8. 2026-03200 mm · thin filmTFLN modulators on 200 mm Si in a BEOL CMOS foundry; 1.87 V cm best on wafer map; chip bandwidth 93-110 GHz (OFC 2026 W1A.3)reported
  9. 2026-036" / 8" · thin filmHyperLight + UMC / Wavetek volume productionT/C
  10. 2026-06-038" bulk LN · bulkTDG Holding states 8-inch LN in mass productionF
  11. undated3"-8" · thin filmNanoLN lists LNOI and LTOI at 3, 4, 6, 8 inchF
  12. undated12" · bulk12-inch optical-grade LN wafer "prepared" (TDG, secondary, unsourced)LG

Dies per wafer

A modulator die is long and narrow; the number that fits on a wafer grows faster than the wafer area because fewer dies are lost at the edge. Set the die size and the edge exclusion.

Dies per wafer: DPW = πd2/(4S) − πd/√(2S), d = D − 2Ederived
10.0 mm
 1.0 mm
 3.0 mm
100 mm
150 mm
200 mm
wafer diameter D100 mm150 mm200 mm
formula DPW   628 1,527 2,820
whole dies placed (drawn)   605 1,482 2,763
ratio to 100 mm (placed)1.002.454.57
S = die area  10.00 mm2. Die size and edge exclusion: display parameters template; default 10 × 1 mm holds a 9 mm traveling-wave electrode (the li2026aa MZM of section 2.2 is 9 mm long). Gross count: no scribe lanes, flats, or yield. Wafers drawn to one scale.
10.0 mm
1.0 mm
3.0 mm
   605 dies placed
100 mm; formula    628
 1,482 dies placed
150 mm; formula  1,527
 2,763 dies placed
200 mm; formula  2,820

DPW = πd2/(4S) − πd/√(2S) with d = D − 2 × edge exclusion and S =  10.00 mm2 derived; the drawn dies are the exact count of whole dies inside the dashed edge-exclusion circle. Die size and edge exclusion are display parameters template; the default 10 × 1 mm die holds a 9 mm electrode like the 2.2 MZM. No scribe lanes, flats, or yield. Wafers to one scale.

Lane rate: research and products

Research: symbol rate per device row, step = yearly maximum◆ TFLN ◇ TFLT
0501001502002502017201820192020202120222023202420252026GBd123
Bottom row: product milestones (grades F, V, T only). Hover a tag; the 400 G/lane tag lights research points above 200 GBd (PAM4, 2 bit per symbol). Maximum per year in the atlas sample; single demonstrations.
0501001502002502017201820192020202120222023202420252026GBd123

Diamonds: TFLN (filled) and TFLT (outline) device rows; steps: yearly maximum in the atlas sample; single demonstrations. Product milestones: grades F, V, T only. Hover a product tag; the 400 G/lane tag lights the research points above 200 GBd that make 400 Gb/s PAM4 possible (2 bit per symbol).

atlas eb97f96 · 2026-10-20 · fetched 2026-10-25 github.com/jwt625/eo-modulator-atlas, no license file upstream

L2 Milestones

dated, graded; reported = authors' values

Wafer milestones

DateMilestoneWaferGrade
2020-08Wafer-scale TFLN PICs, 0.27 dB/cm, DUV lithography4" and 6"reported
2023-09Anpai 8-inch TFLN line completed (reporter claim)8"T
2024-03Jiufengshan Lab: first 8-inch Si-photonic TFLN wafer (reporter claim)8"T
20254-inch TFLN on quartz, > 110 GHz, VπL 2.92 V cm, 50% yield4"reported
2025-06Soitec 150 mm LNOI to CCRAFT; 200 mm shown6" / 8"T
2025-06-09CHIPX first 6-inch TFLN wafer6"T
2026-01-19Ligentec + X-FAB TFLN-on-SiN / SOI200 mmF
2026-03TFLN modulators on 200 mm Si in a BEOL CMOS foundry; 1.87 V cm best on wafer map; chip bandwidth 93-110 GHz (OFC 2026 W1A.3)200 mmreported
2026-03HyperLight + UMC / Wavetek volume production6" / 8"T/C
2026-06-03TDG Holding states 8-inch LN in mass production8" bulk LNF
undatedNanoLN lists LNOI and LTOI at 3, 4, 6, 8 inch3"-8"F
undated12-inch optical-grade LN wafer "prepared" (TDG, secondary, unsourced)12"LG

Lane-rate milestones

DateMilestoneKindGrade
2018100 GBd OOK, 112 Gb/s PAM4, hybrid Si-LN MZM (research; He et al. 2019)researchreported
2022128 GBd PAM16, net 400 Gb/s IM/DD with a TFLN MZM (research)researchreported
2025-04-07AFR: TFLN 130 GBd CDM in volume shipment; 400 Gb/s/lane PAM4 TFLN chip debutproductF/V
2025440 GBd single-wavelength PS-16-ASK through a TFLN modulator (research; outside the atlas sample)researchreported
2026-03420 Gb/s/lane O-band PAM4 TOSA on TFLN, 210 GBd (OFC 2026 W4J.4)researchreported
2026-03768 Gb/s line rate on a TFLT MZM (OFC 2026 Th4A.2, postdeadline)researchreported
2026-03-17HyperLight 1.6T-DR8 TFLN reference transceiver, 20 WproductF/V
2026-06HyperLight: 200 G/lane products available, 400 G/lane samplingproductV

Atlas yearly maximum symbol rate, TFLN: 2017 40, 2018 100, 2020 110, 2021 100, 2022 136, 2023 112, 2024 180, 2025 220, 2026 225 GBd; TFLT: 2024 208, 2025 208, 2026 226 GBd derived.

L3 Reading announcements

  • A "line" announcement is not a capacity figure; wafer starts per month are public only as targets (CCRAFT 2,000 wafers per month by 2030 V).
  • Bulk LN (SAW, 8-inch at TDG) and thin-film LN (LNOI, 8-inch foundry lines) are different wafer products; the ladder labels each milestone with its product.
  • The 12-inch outline carries only an LG-graded secondary claim; no primary source for a 12-inch LN wafer was read.
  • Die counts are gross: the formula πd2/(4S) − πd/√(2S) (usable diameter d, die area S) and the exact number of whole dies placed on a grid inside the usable circle (best of four offsets); no scribe lanes, flats, notch, or yield.

Status key

Vvendor datasheet; not traceable to a specific measurementreportedas reported by the authorsderivedcomputed in the page from the listed inputstemplatedisplay parameter, not a material property

Evidence grade

Ffact from a primary source opened and read (government data, filing, company release or product page)Vvendor claim about its own performance, capacity, or roadmap (read, not checked)Ttrade press, opened and readCseen only as a snippet or aggregator; page not openedLGlow grade (paywalled market teaser, investor forum, AI-assisted finance article): direction onlyEestimate by this site, assumptions stated

License

Code GPL-3.0. Data CC BY 4.0.
Source: github.com/jwt625/lithium-niobate

Pointer effects

Cursor trace: photorefractive index writing (4.1). IR dimming near the pointer: green-induced infrared absorption (4.4).

MZM bias

0π/2π2π 1 ms1 s1 ks1 Ms
Δφ/φ0 = +0.000, locked
lithium-niobate.com2026-10-25