1×10−4 to 2cm−1
Congruent LiNbO3 (CLN); method o and e polarization, 390-3800 nm
| Property | Value | Unit | Variant | Conditions | Frame | Source, locator | Status |
|---|---|---|---|---|---|---|---|
| Absorption coefficient in the transparent range α | 1×10−4 to 2 | cm−1 | CLN (default) | method o and e polarization, 390-3800 nm | – | P(abs) | |
| Activation energy of dark (protonic) conductivity | ≈ 1.1 | eV | CLN (default) | T 200-1000 C | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Sec. 3.2.1, pp. 59-60 | P-comp |
| Birefringence ne - no | −0.0766 | CLN (default) | T 21 °C; λ 1064 nm | – | C | ||
| Birefringence ne - no | −0.0736 | CLN (default) | T 21 °C; λ 1550 nm | – | C | ||
| Birefringence ne - no | −0.0842 | CLN (default) | T 21 °C; λ 632.8 nm | – | C | ||
| Birefringence ne - no | −0.0815 | MgO5 (default) | T 21 °C; λ 1064 nm | – | C | ||
| Birefringence ne - no | −0.0782 | MgO5 (default) | T 21 °C; λ 1550 nm | – | C | ||
| Birefringence ne - no | −0.0897 | MgO5 (default) | T 21 °C; λ 632.8 nm | – | C | ||
| Bulk longitudinal velocity along X vL,X | 6544.53 ± 0.3 | m/s | CLN (default) | method plane-wave ultrasonic, (110) plate | – | P | |
| Bulk longitudinal velocity along Y vL,Y | 6806.55 ± 0.26 | m/s | CLN (default) | method plane-wave ultrasonic, (300) plate | – | P | |
| Bulk longitudinal velocity along Z vL,Z | 7328.2 ± 0.32 | m/s | CLN (default) | method plane-wave ultrasonic, (006) plate | – | P | |
| Bulk shear velocity along X (resonance) vS,X | 4750.67 ± 0.59 | m/s | CLN (default) | method resonance, (110) plate | – | P | |
| Bulk shear velocity along Y vS,Y | 3940.49 ± 0.21 | m/s | CLN (default) | method plane-wave ultrasonic, (300) plate | – | P | |
| Bulk shear velocity along Z vS,Z | 3590.41 ± 0.23 | m/s | CLN (default) | method plane-wave ultrasonic, (006) plate | – | P | |
| Coercive field Ec | 21 | kV/mm | CLN (default) | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 7.1, p. 185 (210 kV/cm, literature average); p. 118 (210-220 kV/cm) | P-comp |
| Coercive field Ec | 2.5 | kV/mm | MgO1-SLN (default) | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 7.1, p. 185 (25 kV/cm) | P-comp |
| Coercive field Ec | 6 to 6.8 | kV/mm | MgO5 (default) | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 7.1, p. 185 (60-68 kV/cm, table average) | P-comp |
| Coercive field Ec | 6 to 6.5 | kV/mm | SLN (default) | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 7.1, p. 185 (60-65 kV/cm) | P-comp |
| Coercive field ratio Ec(CLN)/Ec(SLN) | ≈ 4 to 5 | CLN | T room temperature | – | P(abs) | ||
| Coercive field ratio Ec(CLN)/Ec(SLN) | 3.2 to 3.5 | CLN | – | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 7.1, p. 185; p. 184 ('factor of three', ref. Chen et al. 2001) | C | |
| Congruent composition | 48.45 | mol% Li2O | CLN (default) | – | – | P-comp | |
| Congruent composition | 48.38 ± 0.01 | mol% Li2O | CLN | – | – | Crystal Technology, Inc. (1999) | V |
| Curie temperature TC | 1140 | °C | CLN (default) | – | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Curie temperature TC | 1142.3 ± 0.7 | °C | CLN | – | – | Crystal Technology, Inc. (1999) | V |
| Curie temperature TC | 1206 | °C | SLN (default) | – | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Curie temperature TC | 1213 | °C | SLN | – | – | INSPEC/IEE (2002) | S |
| Curie temperature TC | ≈ 1430 | K | n/s | method neutron powder diffraction | – | P(abs) | |
| Curie temperature TC | 1165 | °C | n/s | – | – | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 1, p. 197 | P-comp |
| Curie temperature vs crystal composition (linear fit) | T_C = 39.26 c - 760.67 (T_C in C, c in mol% Li2O) | °C | n/s (default) | method DTA / dielectric | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Eq. (6.2), p. 140 | P-comp |
| Curie temperature vs crystal composition (linear fit) | T_C = 39.064 c - 746.73 (T_C in C, c in mol% Li2O) | °C | n/s | – | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Eq. (6.3), p. 140 | P-comp |
| Dark conductivity σd | 1×10−16 to 1×10−14 | S/m | CLN (default) | T room temperature, extrapolated from high temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Sec. 3.2.1, pp. 59-60 (1e-16 to 1.0e-18 Ohm^-1 cm^-1) | P-comp |
| Density ρ | 4642.8 ± 0.2 | kg/m3 | CLN (default) | method Archimedes | – | P | |
| Density ρ | 4650 | kg/m3 | CLN | – | – | Crystal Technology, Inc. (1999) | V |
| Density ρ | 4647 | kg/m3 | CLN | – | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Density ρ | 4635 | kg/m3 | SLN (default) | – | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Density ρ | 4636 | kg/m3 | n/s | T 30 °C | – | P | |
| Density ρ | 4628 | kg/m3 | n/s | – | – | P | |
| Elastic stiffness component c14 (constant E), LiTaO3 (comparison material) c14E | −10.75 | GPa | LT SAW (default) | elec. constant E | – | P | |
| Electro-optic coefficient r13, unclamped r13T | 10.4 | pm/V | SLN (default) | mech. free (T); λ 633 nm | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.2, p. 4 | P-comp |
| Electro-optic coefficient r22, unclamped r22T | 6.54 | pm/V | CLN | mech. free (T) | – | P-comp | |
| Electro-optic coefficient r33, LiTaO3 (comparison material) | 30.5 | pm/V | LT (default) | – | – | Wang et al., ACS Photonics 12 5345-5351 (2025), introduction, ref. 29 | S |
| Electro-optic coefficient r33, unclamped r33T | 38 | pm/V | SLN (default) | mech. free (T); λ 633 nm | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.2, p. 4 | P-comp |
| Extraordinary refractive index ne | 2.1555 | CLN (default) | T 21 °C; λ 1064 nm | – | C | ||
| Extraordinary refractive index ne | 2.1376 | CLN (default) | T 21 °C; λ 1550 nm | – | C | ||
| Extraordinary refractive index ne | 2.2022 | CLN (default) | T 21 °C; λ 632.8 nm | – | C | ||
| Extraordinary refractive index ne | 2.2028 | CLN | λ 632.8 nm | – | Crystal Technology, Inc. (1999) | V | |
| Extraordinary refractive index ne | 2.1561 | CLN | T 24.5 °C; λ 1060 nm | – | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 2, p. 197 | P-comp | |
| Extraordinary refractive index ne | 2.2028 | CLN | T 24.5 °C; λ 632.8 nm | – | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 2, p. 197 | P-comp | |
| Extraordinary refractive index ne | 2.1432 | LT (default) | T room temperature; λ 1000 nm | – | Bond, Journal of Applied Physics 36 1674-1677 (1965), refractiveindex.info LiTaO3/Bond-e tabulated data | P-db | |
| Extraordinary refractive index ne | 2.1213 | LT (default) | T room temperature; λ 1600 nm | – | Bond, Journal of Applied Physics 36 1674-1677 (1965), refractiveindex.info LiTaO3/Bond-e tabulated data | P-db | |
| Extraordinary refractive index ne | 2.1878 | LT (default) | T room temperature; λ 600 nm | – | Bond, Journal of Applied Physics 36 1674-1677 (1965), refractiveindex.info LiTaO3/Bond-e tabulated data | P-db | |
| Extraordinary refractive index ne | 2.1474 | MgO5 (default) | T 21 °C; λ 1064 nm | – | C | ||
| Extraordinary refractive index ne | 2.1299 | MgO5 (default) | T 21 °C; λ 1550 nm | – | C | ||
| Extraordinary refractive index ne | 2.1928 | MgO5 (default) | T 21 °C; λ 632.8 nm | – | C | ||
| Extraordinary refractive index ne | 2.19 | SLN (default) | λ 633 nm | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.2, p. 4 (refs. [26-28]) | P-comp | |
| Extraordinary refractive index ne | 2.2005 | SLN | T 25 °C; λ 632.8 nm | – | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 2, p. 197 | P-comp | |
| Hydrostatic piezoelectric coefficient dh = 2 d31 + d33 | 6.31 ± 0.014 | pC/N | n/s (default) | – | – | P-comp | |
| Internal field Eint | ≈ 2.5 | kV/mm | CLN (default) | – | – | P(abs) | |
| Internal field Eint | printed '2-33' kV/cm (likely a misprinted range) | kV/cm | CLN | – | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 7.1, p. 185 | P-comp |
| Internal field Eint | 0.5 | kV/mm | MgO5 (default) | – | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 7.1, p. 185 (5 kV/cm) | P-comp |
| IR transmission cutoff | 4600 | nm | CLN | method 1/e transmission, 1 cm thick | – | Crystal Technology, Inc. (1999) | V |
| Lattice constant a (hexagonal setting) | 5.15 | Å | CLN (default) | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 (515.0 pm) | P-comp |
| Lattice constant a (hexagonal setting) | 5.151 | Å | CLN | – | – | Crystal Technology, Inc. (1999) | V |
| Lattice constant a (hexagonal setting) | 5.147 | Å | SLN (default) | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 (514.7 pm) | P-comp |
| Lattice constant a (hexagonal setting) | 5.148 | Å | n/s (default) | method synchrotron X-ray diffraction; T 293 K (COD CIF) | – | P-db | |
| Lattice constant a (hexagonal setting) | 5.14829 | Å | n/s | method single-crystal neutron diffraction; T 24 °C | – | Crystallography Open Database (2026), COD 1541936 | P-db |
| Lattice constant a (hexagonal setting) | 5.1502 | Å | n/s | – | – | Ohgaki et al., Mineralogical Journal 16 150 (1992), COD 1544665 | P-db |
| Lattice constant a (hexagonal setting) | 5.15 | Å | n/s | – | – | P | |
| Lattice constant c (hexagonal setting) | 13.864 | Å | CLN (default) | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 (1386.4 pm) | P-comp |
| Lattice constant c (hexagonal setting) | 13.866 | Å | CLN | – | – | Crystal Technology, Inc. (1999) | V |
| Lattice constant c (hexagonal setting) | 13.856 | Å | SLN (default) | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 (1385.6 pm) | P-comp |
| Lattice constant c (hexagonal setting) | 13.863 | Å | n/s (default) | method synchrotron X-ray diffraction; T 293 K (COD CIF) | – | P-db | |
| Lattice constant c (hexagonal setting) | 13.8631 | Å | n/s | method single-crystal neutron diffraction; T 24 °C | – | Crystallography Open Database (2026), COD 1541936 | P-db |
| Lattice constant c (hexagonal setting) | 13.8653 | Å | n/s | – | – | Ohgaki et al., Mineralogical Journal 16 150 (1992), COD 1544665 | P-db |
| Maxwell relaxation time (dark) τM | 5 to 500 | days | CLN (default) | – | – | P-comp | |
| Melting point Tm | 1255 | °C | CLN (default) | – | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Melting point Tm | ≈ 1250 | °C | CLN | – | – | Crystal Technology, Inc. (1999) | V |
| Melting point Tm | < 1200 | °C | SLN (default) | – | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| MgO concentration threshold for optical-damage resistance | >= 4.5 at.% MgO | at.% MgO | MgO5 (default) | – | – | P(abs) | |
| Mohs hardness | 5 | Mohs | CLN | – | – | Crystal Technology, Inc. (1999) | V |
| Nonlinear (Kerr) refractive index n2 | 9.33×10−20 | m2/W | n/s (default) | method Z-scan, 30 ps, e-polarization; λ 1064 nm | – | P-db | |
| Nonlinear (Kerr) refractive index n2 | 8.25×10−19 | m2/W | n/s | method Z-scan, 22 ps; λ 532 nm | – | P-db | |
| Nonlinear (Kerr) refractive index n2 | 1.8×10−19 | m2/W | n/s | – | – | S | |
| OH stretch absorption band | 2.87 | µm | CLN (default) | – | – | P(abs) | |
| OH stretch absorption band | 2.83 | µm | MgO5 (default) | – | – | P(abs) | |
| Optical band gap Eg | ≈ 3.7 | eV | n/s (default) | method optical absorption (direct) | – | P(abs) | |
| Ordinary refractive index no | 2.2321 | CLN (default) | T 21 °C; λ 1064 nm | – | C | ||
| Ordinary refractive index no | 2.2111 | CLN (default) | T 21 °C; λ 1550 nm | – | C | ||
| Ordinary refractive index no | 2.2865 | CLN (default) | T 21 °C; λ 632.8 nm | – | C | ||
| Ordinary refractive index no | 2.2866 | CLN | λ 632.8 nm | – | Crystal Technology, Inc. (1999) | V | |
| Ordinary refractive index no | 2.2323 | CLN | T 24.5 °C; λ 1060 nm | – | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 2, p. 197 | P-comp | |
| Ordinary refractive index no | 2.2866 | CLN | T 24.5 °C; λ 632.8 nm | – | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 2, p. 197 | P-comp | |
| Ordinary refractive index no | 2.1391 | LT (default) | T room temperature; λ 1000 nm | – | Bond, Journal of Applied Physics 36 1674-1677 (1965), refractiveindex.info LiTaO3/Bond-o tabulated data | P-db | |
| Ordinary refractive index no | 2.1174 | LT (default) | T room temperature; λ 1600 nm | – | Bond, Journal of Applied Physics 36 1674-1677 (1965), refractiveindex.info LiTaO3/Bond-o tabulated data | P-db | |
| Ordinary refractive index no | 2.1834 | LT (default) | T room temperature; λ 600 nm | – | Bond, Journal of Applied Physics 36 1674-1677 (1965), refractiveindex.info LiTaO3/Bond-o tabulated data | P-db | |
| Ordinary refractive index no | 2.2288 | MgO5 (default) | T 21 °C; λ 1064 nm | – | C | ||
| Ordinary refractive index no | 2.2082 | MgO5 (default) | T 21 °C; λ 1550 nm | – | C | ||
| Ordinary refractive index no | 2.2825 | MgO5 (default) | T 21 °C; λ 632.8 nm | – | C | ||
| Ordinary refractive index no | 2.288 | SLN (default) | λ 633 nm | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.2, p. 4 (refs. [26-28]) | P-comp | |
| Ordinary refractive index no | 2.291 | SLN | T 25 °C; λ 632.8 nm | – | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 2, p. 197 | P-comp | |
| Point group (ferroelectric phase) | 3m (C3v) | n/s (default) | – | – | Weis & Gaylord, Applied Physics A 37 191-203 (1985), p. 192, Sec. 2.1 | P | |
| Pyroelectric coefficient p3 | −8.3×10−5 | C/(m2 K) | CLN | T 25 °C | – | Crystal Technology, Inc. (1999) | V |
| Pyroelectric coefficient p3 | −6.4×10−5 | C/(m2 K) | n/s | T room temperature | – | Schwesyg, Universitat Bonn (2011), Eq. (2.17) | S |
| Pyroelectric coefficient p3 | −4×10−5 | C/(m2 K) | n/s | T room temperature | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Eq. (2), p. 196 | P-comp |
| Residual absorption, as-grown crystals | up to 0.04 cm^-1 (transition-metal impurities, 400-2000 nm); about 0.001 cm^-1 H-related bands at 2300-2800 nm; annealing lowers absorption by up to 10x | cm−1 | CLN (default) | – | – | Schwesyg, Universitat Bonn (2011), abstract; Sec. 3.1, 3.3 | P |
| Rhombohedral cell angle α αR | 55.867 | deg | n/s (default) | – | – | Weis & Gaylord, Applied Physics A 37 191-203 (1985), p. 194, Eq. (1) | P |
| Rhombohedral cell angle α αR | 55.89 ± 0.03 | deg | n/s | – | – | P-db | |
| Rhombohedral cell edge aR | 5.494 | Å | n/s (default) | – | – | Weis & Gaylord, Applied Physics A 37 191-203 (1985), p. 194, Eq. (1) | P |
| Rhombohedral cell edge aR | 5.493 ± 0.002 | Å | n/s | – | – | P-db | |
| Second-order nonlinear coefficient d31 | 4.8 ± 0.5 | pm/V | CLN | method parametric fluorescence, 488 nm pump | – | P(abs) | |
| Second-order nonlinear coefficient d31 | 4.3 ± 0.5 | pm/V | CLN | method parametric fluorescence, 532 nm pump | – | P(abs) | |
| Space group (ferroelectric phase, below Tc) | R3c (No. 161) | n/s (default) | – | – | Weis & Gaylord, Applied Physics A 37 191-203 (1985), p. 192, Sec. 2.1 | P | |
| Space group (paraelectric phase, above Tc) | R-3c (No. 167) | n/s (default) | – | – | Boysen & Altorfer, Acta Crystallographica Section B 50 405 (1994), COD 2101175-2101185 high-temperature entries | P-db | |
| Specific heat capacity cp | 628 | J/(kg K) | CLN (default) | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Specific heat capacity cp | ≈ 628 | J/(kg K) | CLN | T 25 °C | – | Crystal Technology, Inc. (1999) | V |
| Specific heat capacity cp | 651 | J/(kg K) | SLN (default) | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Spontaneous polarization Ps | 80 ± 5 | uC/cm2 | CLN | – | – | P(abs) | |
| Spontaneous polarization Ps | 71 | uC/cm2 | CLN | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 (refs. [22], [24]) | P-comp |
| Thermal conductivity kappa | 3.92 | W/(m K) | CLN (default) | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Thermal conductivity kappa | ≈ 4.2 | W/(m K) | CLN | T 25 °C | – | Crystal Technology, Inc. (1999) | V |
| Thermal conductivity kappa | 5.97 | W/(m K) | SLN (default) | T room temperature | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Thermal conductivity kappa | 5 | W/(m K) | n/s | – | – | Schwesyg, Universitat Bonn (2011), Eq. (2.28) | S |
| Thermal expansion coefficient parallel to c α33 | 4.1×10−6 | 1/K | CLN (default) | T 300 K | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Thermal expansion coefficient parallel to c α33 | 7.5×10−6 | 1/K | CLN | T 25 °C | – | Crystal Technology, Inc. (1999) | V |
| Thermal expansion coefficient parallel to c α33 | 6×10−6 | 1/K | SLN (default) | T 300 K | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Thermal expansion coefficient perpendicular to c α11 | 1.41×10−5 | 1/K | CLN (default) | T 300 K | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Thermal expansion coefficient perpendicular to c α11 | 1.5×10−5 | 1/K | CLN | T 25 °C | – | Crystal Technology, Inc. (1999) | V |
| Thermal expansion coefficient perpendicular to c α11 | 1.41×10−5 | 1/K | SLN (default) | T 300 K | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Thermo-optic coefficient, extraordinary dne/dT | 3.75×10−5 | 1/K | CLN (default) | T 25 °C; λ 1550 nm | – | C | |
| Thermo-optic coefficient, extraordinary dne/dT | 4.01×10−5 | 1/K | CLN | T 25 °C; λ 1064 nm | – | C | |
| Thermo-optic coefficient, extraordinary dne/dT | 4.89×10−5 | 1/K | CLN | T 25 °C; λ 633 nm | – | C | |
| Thermo-optic coefficient, extraordinary dne/dT | 3.34×10−5 | 1/K | CLN | T 300 K; λ 1523 nm | – | S | |
| Thermo-optic coefficient, extraordinary dne/dT | 4.12×10−5 | 1/K | CLN | T 300 K; λ 632 nm | – | Moretti et al., Journal of Applied Physics 98 036101 (2005), Schwesyg 2011 Eqs. (2.26)-(2.27) | C |
| Thermo-optic coefficient, ordinary dno/dT | 5.4×10−6 | 1/K | CLN | T 25 °C; λ 1064 nm | – | Crystal Technology, Inc. (1999) | C |
| Thermo-optic coefficient, ordinary dno/dT | 4.1×10−6 | 1/K | CLN | T 25 °C; λ 1550 nm | – | Crystal Technology, Inc. (1999) | C |
| Thermo-optic coefficient, ordinary dno/dT | 9.4×10−6 | 1/K | CLN | T 25 °C; λ 633 nm | – | Crystal Technology, Inc. (1999) | C |
| Thermo-optic coefficient, ordinary dno/dT | 3.7×10−6 | 1/K | CLN | T 300 K; λ 632 nm | – | Moretti et al., Journal of Applied Physics 98 036101 (2005), Schwesyg 2011 Eqs. (2.26)-(2.27) | C |
| Transparency range | 0.32 to 5 | µm | CLN (default) | – | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.2, p. 4 | P-comp |
| Transparency range | 0.3 to 5 | µm | SLN (default) | – | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.2, p. 4 | P-comp |
| UV absorption edge at α = 20 cm−1 λ20 | 320.4 | nm | CLN (default) | T 22 °C | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Eq. (6.5), p. 142 | C |
| UV absorption edge at α = 20 cm−1 λ20 | 303 | nm | SLN (default) | T 22 °C | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Eq. (6.5), p. 142 | C |
| UV absorption edge vs composition | lambda_20 = 320.4 - 1.829 x - 5.485 x^2 nm; lambda_15 = 321.9 - 1.597 x - 5.745 x^2 nm; x = (mol% Li2O) - 48.38 | nm | n/s (default) | method absorption coefficient 20 (or 15) cm^-1; E parallel to c, k perpendicular to c; T 22 °C | – | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Eqs. (6.5)-(6.6), p. 142 | P-comp |
| UV transmission cutoff | 340 | nm | CLN | method 1/e transmission, 1 cm thick | – | Crystal Technology, Inc. (1999) | V |
| Elastic compliance at constant electric field sE | s11 5.85352, s12 −1.18173, s13 −1.35637, s14 −0.920402, s33 5.05782, s44 16.9493 | 1e-12 m2/N | CLN (default) | elec. constant E | unstated | C | |
| Elastic compliance at constant electric field sE | s11 5.831, s12 −1.15, s13 −1.452, s14 −1, s33 5.026, s44 17.1 | 1e-12 m2/N | n/s | elec. constant E | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 5, p. 200 | P-comp |
| Elastic compliance at constant electric field sE | s11 5.78, s12 −1.01, s13 −1.47, s14 −1.02, s33 5.02, s44 17 | 1e-12 m2/N | n/s | elec. constant E | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 5, p. 200 | P-comp |
| Elastic stiffness at constant electric field cE | c11 198.86, c12 54.67, c13 67.99, c14 7.83, c33 234.18, c44 59.85 | GPa | CLN (default) | elec. constant E | unstated | P | |
| Elastic stiffness at constant electric field cE | c11 199, c12 54.7, c13 70, c14 7.9, c33 240, c44 59.9 | GPa | n/s | elec. constant E | unstated | S | |
| Elastic stiffness at constant electric field cE | c11 199.5, c12 55.27, c13 67.67, c14 8.7, c33 235.2, c44 59.48 | GPa | n/s | elec. constant E; method resonant ultrasound spectroscopy; T 30 °C | unstated | P | |
| Elastic stiffness at constant electric field cE | c11 198.4, c12 54.72, c13 65.13, c14 7.88, c33 227.9, c44 59.65 | GPa | n/s | elec. constant E | unstated | S | |
| Elastic stiffness at constant electric field cE | c11 200, c12 54, c13 60, c14 8, c33 243, c44 60 | GPa | n/s | elec. constant E | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 6, p. 200 | P-comp |
| Elastic stiffness at constant electric field cE | c11 203, c12 57.3, c13 75.2, c14 8.5, c33 242.4, c44 59.5 | GPa | n/s | elec. constant E | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 6, p. 200 (unit 1.0e11 N/m^2) | P-comp |
| Elastic stiffness at constant electric field cE | c11 203, c12 53, c13 75, c14 9, c33 245, c44 60 | GPa | n/s | elec. constant E | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 6, p. 200 | P-comp |
| Linear electro-optic (Pockels) coefficients, clamped (constant strain) rS | r13 9, r22 3, r33 31, r51 28 | pm/V | CLN | f high frequency; mech. clamped (S); λ 633 nm | unstated | Crystal Technology, Inc. (1999) | V |
| Linear electro-optic (Pockels) coefficients, clamped (constant strain) rS | r13 8.6, r22 3.4, r33 30.8, r51 28 | pm/V | CLN | mech. clamped (S); λ 633 nm | IRE-1949 | Turner, Applied Physics Letters 8 303-304 (1966), Weis & Gaylord 1985 Table 4, p. 199 | P-comp |
| Linear electro-optic (Pockels) coefficients, clamped (constant strain) rS | r13 7.7, r22 3.4, r33 28.8, r51 18.2 | pm/V | n/s | mech. clamped (S); λ 633 nm | IRE-1949 | Kaminow et al., Journal of Applied Physics 51 4379-4384 (1980), Weis & Gaylord 1985 Table 4, p. 199 | P-comp |
| Linear electro-optic (Pockels) coefficients, unclamped (constant stress) rT | r13 10, r22 6.81, r33 32.2, r51 32 | pm/V | CLN (default) | mech. free (T); λ 633 nm | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 4, p. 199 | P-comp |
| Linear electro-optic (Pockels) coefficients, unclamped (constant stress) rT | r13 10, r22 7, r33 33, r51 33 | pm/V | CLN | f low frequency; mech. free (T); λ 633 nm | unstated | Crystal Technology, Inc. (1999) | V |
| Photoelastic (strain-optic) coefficients | p11 −0.021, p12 0.06, p13 0.172, p14 −0.052, p31 0.141, p33 0.118, p41 −0.109, p44 0.121 | n/s | λ 633 nm | unstated | Andrushchak et al., Journal of Applied Physics 106 073510 (2009), Sarabalis et al. 2020 Table I; Mytsyk et al. 2021 Table 6 | S | |
| Photoelastic (strain-optic) coefficients | p11 −0.023, p12 0.076, p13 0.147, p14 0.057, p31 0.157, p33 0.141, p41 0.051, p44 0.126 | n/s | λ 633 nm | unstated | Mys et al., Applied Optics 54, 8176 (2015) (2015) | S | |
| Photoelastic (strain-optic) coefficients | p11 −0.026, p12 0.088, p13 0.134, p14 −0.083, p31 0.177, p33 0.07, p41 −0.151, p44 0.145 | n/s | λ 633 nm | unstated | Rodrigues et al. (2023), Eq. 8 | S | |
| Photoelastic (strain-optic) coefficients | p11 −0.026, p12 0.09, p13 0.133, p14 −0.075, p31 0.179, p33 0.071, p41 −0.151, p44 0.146 | n/s | λ 633 nm | unstated | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 7, p. 201 | P-comp | |
| Photoelastic (strain-optic) coefficients | p11 −0.02, p12 0.08, p13 0.13, p14 −0.08, p31 0.17, p33 0.07, p41 −0.15, p44 0.12 | n/s | λ 633 nm | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 7, p. 201 | P-comp | |
| Piezoelectric strain constants d | d15 66.3805, d22 20.2979, d31 −1.03662, d33 8.68973 | pC/N | CLN (default) | – | unstated | C | |
| Piezoelectric strain constants d | d15 69.2, d22 20.8, d31 −0.85, d33 6 | pC/N | CLN | – | unstated | Crystal Technology, Inc. (1999) | V |
| Piezoelectric strain constants d | d15 69.2, d22 20.8, d31 −0.85, d33 6 | pC/N | n/s | – | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 3, p. 198 (unit 1.0e-11 C/N) | P-comp |
| Piezoelectric strain constants d | d15 68, d22 21, d31 −1, d33 6 | pC/N | n/s | – | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 3, p. 198 | P-comp |
| Piezoelectric strain constants d | d15 74, d22 21, d31 −0.87, d33 16 | pC/N | n/s | – | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 3, p. 198 | P-comp |
| Piezoelectric stress constants | e15 3.655, e22 2.407, e31 0.328, e33 1.894 | C/m2 | CLN (default) | – | unstated | P | |
| Piezoelectric stress constants | e15 3.67, e22 2.38, e31 0.34, e33 1.6 | C/m2 | n/s | – | unstated | S | |
| Piezoelectric stress constants | e15 3.65, e22 2.39, e31 0.31, e33 1.72 | C/m2 | n/s | method resonant ultrasound spectroscopy; T 30 °C | unstated | P | |
| Piezoelectric stress constants | e15 3.69, e22 2.42, e31 0.3, e33 1.77 | C/m2 | n/s | – | unstated | S | |
| Piezoelectric stress constants | e15 3.76, e22 2.43, e31 0.23, e33 1.33 | C/m2 | n/s | – | unstated | S | |
| Piezoelectric stress constants | e15 3.7, e22 2.5, e31 0.2, e33 1.3 | C/m2 | n/s | – | unstated | S | |
| Relative permittivity, constant strain (clamped) εS/ε0 | ε11 44.9, ε33 26.7 | relative (eps/eps0) | CLN (default) | f above acoustic resonances; mech. clamped (S); method derived in the source's fit | unstated | P | |
| Relative permittivity, constant strain (clamped) εS/ε0 | ε11 44, ε33 27.9 | relative (eps/eps0) | CLN | f > 10 MHz; mech. clamped (S) | unstated | Crystal Technology, Inc. (1999) | V |
| Relative permittivity, constant strain (clamped) εS/ε0 | ε11 44, ε33 29 | relative (eps/eps0) | CLN | mech. clamped (S) | unstated | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Relative permittivity, constant strain (clamped) εS/ε0 | ε11 44, ε33 29 | relative (eps/eps0) | n/s | mech. clamped (S) | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 1, p. 197 | P-comp |
| Relative permittivity, constant strain (clamped) εS/ε0 | ε11 46.5, ε33 27.3 | relative (eps/eps0) | n/s | mech. clamped (S) | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 1, p. 197 | P-comp |
| Relative permittivity, constant strain (clamped) εS/ε0 | ε11 44.3, ε33 27.9 | relative (eps/eps0) | n/s | mech. clamped (S) | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 1, p. 197 | P-comp |
| Relative permittivity, constant strain (clamped) εS/ε0 | ε11 43.9, ε33 23.7 | relative (eps/eps0) | n/s | mech. clamped (S) | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 1, p. 197 | P-comp |
| Relative permittivity, constant stress (free) εT/ε0 | ε11 83.3, ε33 28.5 | relative (eps/eps0) | CLN (default) | f low frequency (below acoustic resonances); mech. free (T); method measured | unstated | P | |
| Relative permittivity, constant stress (free) εT/ε0 | ε11 85, ε33 28.7 | relative (eps/eps0) | CLN | f < 500 kHz; mech. free (T) | unstated | Crystal Technology, Inc. (1999) | V |
| Relative permittivity, constant stress (free) εT/ε0 | ε11 84, ε33 30 | relative (eps/eps0) | CLN | mech. free (T) | unstated | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.1, p. 3 | P-comp |
| Relative permittivity, constant stress (free) εT/ε0 | ε11 84, ε33 30 | relative (eps/eps0) | n/s | mech. free (T) | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 1, p. 197 | P-comp |
| Relative permittivity, constant stress (free) εT/ε0 | ε11 84.6, ε33 28.6 | relative (eps/eps0) | n/s | mech. free (T) | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 1, p. 197 | P-comp |
| Relative permittivity, constant stress (free) εT/ε0 | ε11 84.1, ε33 28.1 | relative (eps/eps0) | n/s | mech. free (T) | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 1, p. 197 | P-comp |
| Relative permittivity, constant stress (free) εT/ε0 | ε11 85.2, ε33 28.7 | relative (eps/eps0) | n/s | mech. free (T) | IRE-1949 | Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 1, p. 197 | P-comp |
| Second-order nonlinear optical coefficients d (SHG) | d22 3, d31 −5, d33 −33 | pm/V | CLN | λ 1060 nm | unstated | Crystal Technology, Inc. (1999) | V |
| Second-order nonlinear optical coefficients d (SHG) | d22 3, d31 6, d33 34 | pm/V | CLN | fundamental 1.06 um; λ 1060 nm | unstated | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.2, p. 4 | P-comp |
| Second-order nonlinear optical coefficients d (SHG) | d22 2.5, d31 5, d33 42 | pm/V | SLN | fundamental 1.06 um; λ 1060 nm | unstated | Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 1.2, p. 4 | P-comp |
| Second-order nonlinear optical coefficients d (SHG) | d22 2.1, d31 −4.3, d33 −27 | pm/V | n/s | λ 1064 nm | unstated | S |
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Status: P primary source read at the locator; P(abs) only the abstract read; P-comp read in a compilation that names the original measurement; original not read; P-db CC0 database transcription of a primary source; S secondary source quoting the original; V vendor datasheet; not traceable to a specific measurement; C computed from listed inputs. Unverified claims (39) are not in this table: /api/v1/unverified.json.