PPLN Λ = 6.82 µm · 1064 → 532 nm · 2 px/µm

Data

Records

143 scalar + 49 tensor records, 280 sources; alternatives listed side by side, never averaged
Kind
Variant
Status
192 of 192 records
PropertyValueUnitVariantConditionsFrameSource, locatorStatus
Absorption coefficient in the transparent range α
1×10−4 to 2
cm−1CLN (default)
method o and e polarization, 390-3800 nm
–P(abs)
Activation energy of dark (protonic) conductivity
≈ 1.1
eVCLN (default)
T 200-1000 C
–P-comp
Birefringence ne - no
−0.0766
CLN (default)
T 21 °C; λ 1064 nm
–C
Birefringence ne - no
−0.0736
CLN (default)
T 21 °C; λ 1550 nm
–C
Birefringence ne - no
−0.0842
CLN (default)
T 21 °C; λ 632.8 nm
–C
Birefringence ne - no
−0.0815
MgO5 (default)
T 21 °C; λ 1064 nm
–C
Birefringence ne - no
−0.0782
MgO5 (default)
T 21 °C; λ 1550 nm
–C
Birefringence ne - no
−0.0897
MgO5 (default)
T 21 °C; λ 632.8 nm
–C
Bulk longitudinal velocity along X vL,X
6544.53 ± 0.3
m/sCLN (default)
method plane-wave ultrasonic, (110) plate
–P
Bulk longitudinal velocity along Y vL,Y
6806.55 ± 0.26
m/sCLN (default)
method plane-wave ultrasonic, (300) plate
–P
Bulk longitudinal velocity along Z vL,Z
7328.2 ± 0.32
m/sCLN (default)
method plane-wave ultrasonic, (006) plate
–P
Bulk shear velocity along X (resonance) vS,X
4750.67 ± 0.59
m/sCLN (default)
method resonance, (110) plate
–P
Bulk shear velocity along Y vS,Y
3940.49 ± 0.21
m/sCLN (default)
method plane-wave ultrasonic, (300) plate
–P
Bulk shear velocity along Z vS,Z
3590.41 ± 0.23
m/sCLN (default)
method plane-wave ultrasonic, (006) plate
–P
Coercive field Ec
21
kV/mmCLN (default)
T room temperature
–
Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 7.1, p. 185 (210 kV/cm, literature average); p. 118 (210-220 kV/cm)
P-comp
Coercive field Ec
2.5
kV/mmMgO1-SLN (default)
T room temperature
–P-comp
Coercive field Ec
6 to 6.8
kV/mmMgO5 (default)
T room temperature
–
Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 7.1, p. 185 (60-68 kV/cm, table average)
P-comp
Coercive field Ec
6 to 6.5
kV/mmSLN (default)
T room temperature
–P-comp
Coercive field ratio Ec(CLN)/Ec(SLN)
≈ 4 to 5
CLN
T room temperature
–P(abs)
Coercive field ratio Ec(CLN)/Ec(SLN)
3.2 to 3.5
CLN
–
–
Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Table 7.1, p. 185; p. 184 ('factor of three', ref. Chen et al. 2001)
C
Congruent composition
48.45
mol% Li2OCLN (default)
–
–P-comp
Congruent composition
48.38 ± 0.01
mol% Li2OCLN
–
–
Crystal Technology, Inc. (1999)
V
Curie temperature TC
1140
°CCLN (default)
–
–P-comp
Curie temperature TC
1142.3 ± 0.7
°CCLN
–
–
Crystal Technology, Inc. (1999)
V
Curie temperature TC
1206
°CSLN (default)
–
–P-comp
Curie temperature TC
1213
°CSLN
–
–
INSPEC/IEE (2002)
S
Curie temperature TC
≈ 1430
Kn/s
method neutron powder diffraction
–P(abs)
Curie temperature TC
1165
°Cn/s
–
–P-comp
Curie temperature vs crystal composition (linear fit)
T_C = 39.26 c - 760.67 (T_C in C, c in mol% Li2O)
°Cn/s (default)
method DTA / dielectric
–P-comp
Curie temperature vs crystal composition (linear fit)
T_C = 39.064 c - 746.73 (T_C in C, c in mol% Li2O)
°Cn/s
–
–P-comp
Dark conductivity σd
1×10−16 to 1×10−14
S/mCLN (default)
T room temperature, extrapolated from high temperature
–
Volk & Wöhlecke, Springer Series in Materials Science 115 (2009), Sec. 3.2.1, pp. 59-60 (1e-16 to 1.0e-18 Ohm^-1 cm^-1)
P-comp
Density ρ
4642.8 ± 0.2
kg/m3CLN (default)
method Archimedes
–P
Density ρ
4650
kg/m3CLN
–
–
Crystal Technology, Inc. (1999)
V
Density ρ
4647
kg/m3CLN
–
–P-comp
Density ρ
4635
kg/m3SLN (default)
–
–P-comp
Density ρ
4636
kg/m3n/s
T 30 °C
–P
Density ρ
4628
kg/m3n/s
–
–P
Elastic stiffness component c14 (constant E), LiTaO3 (comparison material) c14E
−10.75
GPaLT SAW (default)
elec. constant E
–P
Electro-optic coefficient r13, unclamped r13T
10.4
pm/VSLN (default)
mech. free (T); λ 633 nm
–P-comp
Electro-optic coefficient r22, unclamped r22T
6.54
pm/VCLN
mech. free (T)
–P-comp
Electro-optic coefficient r33, LiTaO3 (comparison material)
30.5
pm/VLT (default)
–
–S
Electro-optic coefficient r33, unclamped r33T
38
pm/VSLN (default)
mech. free (T); λ 633 nm
–P-comp
Extraordinary refractive index ne
2.1555
CLN (default)
T 21 °C; λ 1064 nm
–C
Extraordinary refractive index ne
2.1376
CLN (default)
T 21 °C; λ 1550 nm
–C
Extraordinary refractive index ne
2.2022
CLN (default)
T 21 °C; λ 632.8 nm
–C
Extraordinary refractive index ne
2.2028
CLN
λ 632.8 nm
–
Crystal Technology, Inc. (1999)
V
Extraordinary refractive index ne
2.1561
CLN
T 24.5 °C; λ 1060 nm
–P-comp
Extraordinary refractive index ne
2.2028
CLN
T 24.5 °C; λ 632.8 nm
–P-comp
Extraordinary refractive index ne
2.1432
LT (default)
T room temperature; λ 1000 nm
–
Bond, Journal of Applied Physics 36 1674-1677 (1965), refractiveindex.info LiTaO3/Bond-e tabulated data
P-db
Extraordinary refractive index ne
2.1213
LT (default)
T room temperature; λ 1600 nm
–
Bond, Journal of Applied Physics 36 1674-1677 (1965), refractiveindex.info LiTaO3/Bond-e tabulated data
P-db
Extraordinary refractive index ne
2.1878
LT (default)
T room temperature; λ 600 nm
–
Bond, Journal of Applied Physics 36 1674-1677 (1965), refractiveindex.info LiTaO3/Bond-e tabulated data
P-db
Extraordinary refractive index ne
2.1474
MgO5 (default)
T 21 °C; λ 1064 nm
–C
Extraordinary refractive index ne
2.1299
MgO5 (default)
T 21 °C; λ 1550 nm
–C
Extraordinary refractive index ne
2.1928
MgO5 (default)
T 21 °C; λ 632.8 nm
–C
Extraordinary refractive index ne
2.19
SLN (default)
λ 633 nm
–P-comp
Extraordinary refractive index ne
2.2005
SLN
T 25 °C; λ 632.8 nm
–P-comp
Hydrostatic piezoelectric coefficient dh = 2 d31 + d33
6.31 ± 0.014
pC/Nn/s (default)
–
–P-comp
Internal field Eint
≈ 2.5
kV/mmCLN (default)
–
–P(abs)
Internal field Eint
printed '2-33' kV/cm (likely a misprinted range)
kV/cmCLN
–
–P-comp
Internal field Eint
0.5
kV/mmMgO5 (default)
–
–P-comp
IR transmission cutoff
4600
nmCLN
method 1/e transmission, 1 cm thick
–
Crystal Technology, Inc. (1999)
V
Lattice constant a (hexagonal setting)
5.15
ÅCLN (default)
T room temperature
–P-comp
Lattice constant a (hexagonal setting)
5.151
ÅCLN
–
–
Crystal Technology, Inc. (1999)
V
Lattice constant a (hexagonal setting)
5.147
ÅSLN (default)
T room temperature
–P-comp
Lattice constant a (hexagonal setting)
5.148
Ån/s (default)
method synchrotron X-ray diffraction; T 293 K (COD CIF)
–P-db
Lattice constant a (hexagonal setting)
5.14829
Ån/s
method single-crystal neutron diffraction; T 24 °C
–
Crystallography Open Database (2026), COD 1541936
P-db
Lattice constant a (hexagonal setting)
5.1502
Ån/s
–
–
Ohgaki et al., Mineralogical Journal 16 150 (1992), COD 1544665
P-db
Lattice constant a (hexagonal setting)
5.15
Ån/s
–
–P
Lattice constant c (hexagonal setting)
13.864
ÅCLN (default)
T room temperature
–P-comp
Lattice constant c (hexagonal setting)
13.866
ÅCLN
–
–
Crystal Technology, Inc. (1999)
V
Lattice constant c (hexagonal setting)
13.856
ÅSLN (default)
T room temperature
–P-comp
Lattice constant c (hexagonal setting)
13.863
Ån/s (default)
method synchrotron X-ray diffraction; T 293 K (COD CIF)
–P-db
Lattice constant c (hexagonal setting)
13.8631
Ån/s
method single-crystal neutron diffraction; T 24 °C
–
Crystallography Open Database (2026), COD 1541936
P-db
Lattice constant c (hexagonal setting)
13.8653
Ån/s
–
–
Ohgaki et al., Mineralogical Journal 16 150 (1992), COD 1544665
P-db
Maxwell relaxation time (dark) τM
5 to 500
daysCLN (default)
–
–P-comp
Melting point Tm
1255
°CCLN (default)
–
–P-comp
Melting point Tm
≈ 1250
°CCLN
–
–
Crystal Technology, Inc. (1999)
V
Melting point Tm
< 1200
°CSLN (default)
–
–P-comp
MgO concentration threshold for optical-damage resistance
>= 4.5 at.% MgO
at.% MgOMgO5 (default)
–
–P(abs)
Mohs hardness
5
MohsCLN
–
–
Crystal Technology, Inc. (1999)
V
Nonlinear (Kerr) refractive index n2
9.33×10−20
m2/Wn/s (default)
method Z-scan, 30 ps, e-polarization; λ 1064 nm
–P-db
Nonlinear (Kerr) refractive index n2
8.25×10−19
m2/Wn/s
method Z-scan, 22 ps; λ 532 nm
–P-db
Nonlinear (Kerr) refractive index n2
1.8×10−19
m2/Wn/s
–
–S
OH stretch absorption band
2.87
µmCLN (default)
–
–P(abs)
OH stretch absorption band
2.83
µmMgO5 (default)
–
–P(abs)
Optical band gap Eg
≈ 3.7
eVn/s (default)
method optical absorption (direct)
–P(abs)
Ordinary refractive index no
2.2321
CLN (default)
T 21 °C; λ 1064 nm
–C
Ordinary refractive index no
2.2111
CLN (default)
T 21 °C; λ 1550 nm
–C
Ordinary refractive index no
2.2865
CLN (default)
T 21 °C; λ 632.8 nm
–C
Ordinary refractive index no
2.2866
CLN
λ 632.8 nm
–
Crystal Technology, Inc. (1999)
V
Ordinary refractive index no
2.2323
CLN
T 24.5 °C; λ 1060 nm
–P-comp
Ordinary refractive index no
2.2866
CLN
T 24.5 °C; λ 632.8 nm
–P-comp
Ordinary refractive index no
2.1391
LT (default)
T room temperature; λ 1000 nm
–
Bond, Journal of Applied Physics 36 1674-1677 (1965), refractiveindex.info LiTaO3/Bond-o tabulated data
P-db
Ordinary refractive index no
2.1174
LT (default)
T room temperature; λ 1600 nm
–
Bond, Journal of Applied Physics 36 1674-1677 (1965), refractiveindex.info LiTaO3/Bond-o tabulated data
P-db
Ordinary refractive index no
2.1834
LT (default)
T room temperature; λ 600 nm
–
Bond, Journal of Applied Physics 36 1674-1677 (1965), refractiveindex.info LiTaO3/Bond-o tabulated data
P-db
Ordinary refractive index no
2.2288
MgO5 (default)
T 21 °C; λ 1064 nm
–C
Ordinary refractive index no
2.2082
MgO5 (default)
T 21 °C; λ 1550 nm
–C
Ordinary refractive index no
2.2825
MgO5 (default)
T 21 °C; λ 632.8 nm
–C
Ordinary refractive index no
2.288
SLN (default)
λ 633 nm
–P-comp
Ordinary refractive index no
2.291
SLN
T 25 °C; λ 632.8 nm
–P-comp
Point group (ferroelectric phase)
3m (C3v)
n/s (default)
–
–P
Pyroelectric coefficient p3
−8.3×10−5
C/(m2 K)CLN
T 25 °C
–
Crystal Technology, Inc. (1999)
V
Pyroelectric coefficient p3
−6.4×10−5
C/(m2 K)n/s
T room temperature
–
Schwesyg, Universitat Bonn (2011), Eq. (2.17)
S
Pyroelectric coefficient p3
−4×10−5
C/(m2 K)n/s
T room temperature
IRE-1949P-comp
Residual absorption, as-grown crystals
up to 0.04 cm^-1 (transition-metal impurities, 400-2000 nm); about 0.001 cm^-1 H-related bands at 2300-2800 nm; annealing lowers absorption by up to 10x
cm−1CLN (default)
–
–
Schwesyg, Universitat Bonn (2011), abstract; Sec. 3.1, 3.3
P
Rhombohedral cell angle α αR
55.867
degn/s (default)
–
–P
Rhombohedral cell angle α αR
55.89 ± 0.03
degn/s
–
–P-db
Rhombohedral cell edge aR
5.494
Ån/s (default)
–
–P
Rhombohedral cell edge aR
5.493 ± 0.002
Ån/s
–
–P-db
Second-order nonlinear coefficient d31
4.8 ± 0.5
pm/VCLN
method parametric fluorescence, 488 nm pump
–P(abs)
Second-order nonlinear coefficient d31
4.3 ± 0.5
pm/VCLN
method parametric fluorescence, 532 nm pump
–P(abs)
Space group (ferroelectric phase, below Tc)
R3c (No. 161)
n/s (default)
–
–P
Space group (paraelectric phase, above Tc)
R-3c (No. 167)
n/s (default)
–
–
Boysen & Altorfer, Acta Crystallographica Section B 50 405 (1994), COD 2101175-2101185 high-temperature entries
P-db
Specific heat capacity cp
628
J/(kg K)CLN (default)
T room temperature
–P-comp
Specific heat capacity cp
≈ 628
J/(kg K)CLN
T 25 °C
–
Crystal Technology, Inc. (1999)
V
Specific heat capacity cp
651
J/(kg K)SLN (default)
T room temperature
–P-comp
Spontaneous polarization Ps
80 ± 5
uC/cm2CLN
–
–P(abs)
Spontaneous polarization Ps
71
uC/cm2CLN
T room temperature
–P-comp
Thermal conductivity kappa
3.92
W/(m K)CLN (default)
T room temperature
–P-comp
Thermal conductivity kappa
≈ 4.2
W/(m K)CLN
T 25 °C
–
Crystal Technology, Inc. (1999)
V
Thermal conductivity kappa
5.97
W/(m K)SLN (default)
T room temperature
–P-comp
Thermal conductivity kappa
5
W/(m K)n/s
–
–
Schwesyg, Universitat Bonn (2011), Eq. (2.28)
S
Thermal expansion coefficient parallel to c α33
4.1×10−6
1/KCLN (default)
T 300 K
–P-comp
Thermal expansion coefficient parallel to c α33
7.5×10−6
1/KCLN
T 25 °C
–
Crystal Technology, Inc. (1999)
V
Thermal expansion coefficient parallel to c α33
6×10−6
1/KSLN (default)
T 300 K
–P-comp
Thermal expansion coefficient perpendicular to c α11
1.41×10−5
1/KCLN (default)
T 300 K
–P-comp
Thermal expansion coefficient perpendicular to c α11
1.5×10−5
1/KCLN
T 25 °C
–
Crystal Technology, Inc. (1999)
V
Thermal expansion coefficient perpendicular to c α11
1.41×10−5
1/KSLN (default)
T 300 K
–P-comp
Thermo-optic coefficient, extraordinary dne/dT
3.75×10−5
1/KCLN (default)
T 25 °C; λ 1550 nm
–C
Thermo-optic coefficient, extraordinary dne/dT
4.01×10−5
1/KCLN
T 25 °C; λ 1064 nm
–C
Thermo-optic coefficient, extraordinary dne/dT
4.89×10−5
1/KCLN
T 25 °C; λ 633 nm
–C
Thermo-optic coefficient, extraordinary dne/dT
3.34×10−5
1/KCLN
T 300 K; λ 1523 nm
–S
Thermo-optic coefficient, extraordinary dne/dT
4.12×10−5
1/KCLN
T 300 K; λ 632 nm
–C
Thermo-optic coefficient, ordinary dno/dT
5.4×10−6
1/KCLN
T 25 °C; λ 1064 nm
–
Crystal Technology, Inc. (1999)
C
Thermo-optic coefficient, ordinary dno/dT
4.1×10−6
1/KCLN
T 25 °C; λ 1550 nm
–
Crystal Technology, Inc. (1999)
C
Thermo-optic coefficient, ordinary dno/dT
9.4×10−6
1/KCLN
T 25 °C; λ 633 nm
–
Crystal Technology, Inc. (1999)
C
Thermo-optic coefficient, ordinary dno/dT
3.7×10−6
1/KCLN
T 300 K; λ 632 nm
–C
Transparency range
0.32 to 5
µmCLN (default)
–
–P-comp
Transparency range
0.3 to 5
µmSLN (default)
–
–P-comp
UV absorption edge at α = 20 cm−1 λ20
320.4
nmCLN (default)
T 22 °C
–C
UV absorption edge at α = 20 cm−1 λ20
303
nmSLN (default)
T 22 °C
–C
UV absorption edge vs composition
lambda_20 = 320.4 - 1.829 x - 5.485 x^2 nm; lambda_15 = 321.9 - 1.597 x - 5.745 x^2 nm; x = (mol% Li2O) - 48.38
nmn/s (default)
method absorption coefficient 20 (or 15) cm^-1; E parallel to c, k perpendicular to c; T 22 °C
–P-comp
UV transmission cutoff
340
nmCLN
method 1/e transmission, 1 cm thick
–
Crystal Technology, Inc. (1999)
V
Elastic compliance at constant electric field sE
s11 5.85352, s12 −1.18173, s13 −1.35637, s14 −0.920402, s33 5.05782, s44 16.9493
1e-12 m2/NCLN (default)
elec. constant E
unstatedC
Elastic compliance at constant electric field sE
s11 5.831, s12 −1.15, s13 −1.452, s14 −1, s33 5.026, s44 17.1
1e-12 m2/Nn/s
elec. constant E
IRE-1949P-comp
Elastic compliance at constant electric field sE
s11 5.78, s12 −1.01, s13 −1.47, s14 −1.02, s33 5.02, s44 17
1e-12 m2/Nn/s
elec. constant E
IRE-1949P-comp
Elastic stiffness at constant electric field cE
c11 198.86, c12 54.67, c13 67.99, c14 7.83, c33 234.18, c44 59.85
GPaCLN (default)
elec. constant E
unstatedP
Elastic stiffness at constant electric field cE
c11 199, c12 54.7, c13 70, c14 7.9, c33 240, c44 59.9
GPan/s
elec. constant E
unstatedS
Elastic stiffness at constant electric field cE
c11 199.5, c12 55.27, c13 67.67, c14 8.7, c33 235.2, c44 59.48
GPan/s
elec. constant E; method resonant ultrasound spectroscopy; T 30 °C
unstatedP
Elastic stiffness at constant electric field cE
c11 198.4, c12 54.72, c13 65.13, c14 7.88, c33 227.9, c44 59.65
GPan/s
elec. constant E
unstatedS
Elastic stiffness at constant electric field cE
c11 200, c12 54, c13 60, c14 8, c33 243, c44 60
GPan/s
elec. constant E
IRE-1949P-comp
Elastic stiffness at constant electric field cE
c11 203, c12 57.3, c13 75.2, c14 8.5, c33 242.4, c44 59.5
GPan/s
elec. constant E
IRE-1949
Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 6, p. 200 (unit 1.0e11 N/m^2)
P-comp
Elastic stiffness at constant electric field cE
c11 203, c12 53, c13 75, c14 9, c33 245, c44 60
GPan/s
elec. constant E
IRE-1949P-comp
Linear electro-optic (Pockels) coefficients, clamped (constant strain) rS
r13 9, r22 3, r33 31, r51 28
pm/VCLN
f high frequency; mech. clamped (S); λ 633 nm
unstated
Crystal Technology, Inc. (1999)
V
Linear electro-optic (Pockels) coefficients, clamped (constant strain) rS
r13 8.6, r22 3.4, r33 30.8, r51 28
pm/VCLN
mech. clamped (S); λ 633 nm
IRE-1949
Turner, Applied Physics Letters 8 303-304 (1966), Weis & Gaylord 1985 Table 4, p. 199
P-comp
Linear electro-optic (Pockels) coefficients, clamped (constant strain) rS
r13 7.7, r22 3.4, r33 28.8, r51 18.2
pm/Vn/s
mech. clamped (S); λ 633 nm
IRE-1949P-comp
Linear electro-optic (Pockels) coefficients, unclamped (constant stress) rT
r13 10, r22 6.81, r33 32.2, r51 32
pm/VCLN (default)
mech. free (T); λ 633 nm
IRE-1949P-comp
Linear electro-optic (Pockels) coefficients, unclamped (constant stress) rT
r13 10, r22 7, r33 33, r51 33
pm/VCLN
f low frequency; mech. free (T); λ 633 nm
unstated
Crystal Technology, Inc. (1999)
V
Photoelastic (strain-optic) coefficients
p11 −0.021, p12 0.06, p13 0.172, p14 −0.052, p31 0.141, p33 0.118, p41 −0.109, p44 0.121
n/s
λ 633 nm
unstated
Andrushchak et al., Journal of Applied Physics 106 073510 (2009), Sarabalis et al. 2020 Table I; Mytsyk et al. 2021 Table 6
S
Photoelastic (strain-optic) coefficients
p11 −0.023, p12 0.076, p13 0.147, p14 0.057, p31 0.157, p33 0.141, p41 0.051, p44 0.126
n/s
λ 633 nm
unstated
Mys et al., Applied Optics 54, 8176 (2015) (2015)
S
Photoelastic (strain-optic) coefficients
p11 −0.026, p12 0.088, p13 0.134, p14 −0.083, p31 0.177, p33 0.07, p41 −0.151, p44 0.145
n/s
λ 633 nm
unstated
Rodrigues et al. (2023), Eq. 8
S
Photoelastic (strain-optic) coefficients
p11 −0.026, p12 0.09, p13 0.133, p14 −0.075, p31 0.179, p33 0.071, p41 −0.151, p44 0.146
n/s
λ 633 nm
unstatedP-comp
Photoelastic (strain-optic) coefficients
p11 −0.02, p12 0.08, p13 0.13, p14 −0.08, p31 0.17, p33 0.07, p41 −0.15, p44 0.12
n/s
λ 633 nm
IRE-1949P-comp
Piezoelectric strain constants d
d15 66.3805, d22 20.2979, d31 −1.03662, d33 8.68973
pC/NCLN (default)
–
unstatedC
Piezoelectric strain constants d
d15 69.2, d22 20.8, d31 −0.85, d33 6
pC/NCLN
–
unstated
Crystal Technology, Inc. (1999)
V
Piezoelectric strain constants d
d15 69.2, d22 20.8, d31 −0.85, d33 6
pC/Nn/s
–
IRE-1949
Weis & Gaylord, Applied Physics A 37 191-203 (1985), Table 3, p. 198 (unit 1.0e-11 C/N)
P-comp
Piezoelectric strain constants d
d15 68, d22 21, d31 −1, d33 6
pC/Nn/s
–
IRE-1949P-comp
Piezoelectric strain constants d
d15 74, d22 21, d31 −0.87, d33 16
pC/Nn/s
–
IRE-1949P-comp
Piezoelectric stress constants
e15 3.655, e22 2.407, e31 0.328, e33 1.894
C/m2CLN (default)
–
unstatedP
Piezoelectric stress constants
e15 3.67, e22 2.38, e31 0.34, e33 1.6
C/m2n/s
–
unstatedS
Piezoelectric stress constants
e15 3.65, e22 2.39, e31 0.31, e33 1.72
C/m2n/s
method resonant ultrasound spectroscopy; T 30 °C
unstatedP
Piezoelectric stress constants
e15 3.69, e22 2.42, e31 0.3, e33 1.77
C/m2n/s
–
unstatedS
Piezoelectric stress constants
e15 3.76, e22 2.43, e31 0.23, e33 1.33
C/m2n/s
–
unstatedS
Piezoelectric stress constants
e15 3.7, e22 2.5, e31 0.2, e33 1.3
C/m2n/s
–
unstatedS
Relative permittivity, constant strain (clamped) εS/ε0
ε11 44.9, ε33 26.7
relative (eps/eps0)CLN (default)
f above acoustic resonances; mech. clamped (S); method derived in the source's fit
unstatedP
Relative permittivity, constant strain (clamped) εS/ε0
ε11 44, ε33 27.9
relative (eps/eps0)CLN
f > 10 MHz; mech. clamped (S)
unstated
Crystal Technology, Inc. (1999)
V
Relative permittivity, constant strain (clamped) εS/ε0
ε11 44, ε33 29
relative (eps/eps0)CLN
mech. clamped (S)
unstatedP-comp
Relative permittivity, constant strain (clamped) εS/ε0
ε11 44, ε33 29
relative (eps/eps0)n/s
mech. clamped (S)
IRE-1949P-comp
Relative permittivity, constant strain (clamped) εS/ε0
ε11 46.5, ε33 27.3
relative (eps/eps0)n/s
mech. clamped (S)
IRE-1949P-comp
Relative permittivity, constant strain (clamped) εS/ε0
ε11 44.3, ε33 27.9
relative (eps/eps0)n/s
mech. clamped (S)
IRE-1949P-comp
Relative permittivity, constant strain (clamped) εS/ε0
ε11 43.9, ε33 23.7
relative (eps/eps0)n/s
mech. clamped (S)
IRE-1949P-comp
Relative permittivity, constant stress (free) εT/ε0
ε11 83.3, ε33 28.5
relative (eps/eps0)CLN (default)
f low frequency (below acoustic resonances); mech. free (T); method measured
unstatedP
Relative permittivity, constant stress (free) εT/ε0
ε11 85, ε33 28.7
relative (eps/eps0)CLN
f < 500 kHz; mech. free (T)
unstated
Crystal Technology, Inc. (1999)
V
Relative permittivity, constant stress (free) εT/ε0
ε11 84, ε33 30
relative (eps/eps0)CLN
mech. free (T)
unstatedP-comp
Relative permittivity, constant stress (free) εT/ε0
ε11 84, ε33 30
relative (eps/eps0)n/s
mech. free (T)
IRE-1949P-comp
Relative permittivity, constant stress (free) εT/ε0
ε11 84.6, ε33 28.6
relative (eps/eps0)n/s
mech. free (T)
IRE-1949P-comp
Relative permittivity, constant stress (free) εT/ε0
ε11 84.1, ε33 28.1
relative (eps/eps0)n/s
mech. free (T)
IRE-1949P-comp
Relative permittivity, constant stress (free) εT/ε0
ε11 85.2, ε33 28.7
relative (eps/eps0)n/s
mech. free (T)
IRE-1949P-comp
Second-order nonlinear optical coefficients d (SHG)
d22 3, d31 −5, d33 −33
pm/VCLN
λ 1060 nm
unstated
Crystal Technology, Inc. (1999)
V
Second-order nonlinear optical coefficients d (SHG)
d22 3, d31 6, d33 34
pm/VCLN
fundamental 1.06 um; λ 1060 nm
unstatedP-comp
Second-order nonlinear optical coefficients d (SHG)
d22 2.5, d31 5, d33 42
pm/VSLN
fundamental 1.06 um; λ 1060 nm
unstatedP-comp
Second-order nonlinear optical coefficients d (SHG)
d22 2.1, d31 −4.3, d33 −27
pm/Vn/s
λ 1064 nm
unstatedS
Curie temperatureV
1142.3 ± 0.7°C
Congruent LiNbO3 (CLN)(48.38 mol% Li2O)
Crystal Technology, Inc. (1999)
Curie temperatureS
1213°C
Stoichiometric or near-stoichiometric LiNbO3 (SLN)
INSPEC/IEE (2002)
DensityV
4650kg/m3
Congruent LiNbO3 (CLN)
Crystal Technology, Inc. (1999)
IR transmission cutoffV
4600nm
Congruent LiNbO3 (CLN); method 1/e transmission, 1 cm thick
Crystal Technology, Inc. (1999)
Lattice constant a (hexagonal setting)P-db
5.14829Å
Composition not stated(1966 crystal, composition not stated); method single-crystal neutron diffraction; T 24 °C
Crystallography Open Database (2026), COD 1541936
Lattice constant c (hexagonal setting)P-db
13.8631Å
Composition not stated(1966 crystal, composition not stated); method single-crystal neutron diffraction; T 24 °C
Crystallography Open Database (2026), COD 1541936
Melting pointV
≈ 1250°C
Congruent LiNbO3 (CLN)
Crystal Technology, Inc. (1999)
Mohs hardnessV
5Mohs
Congruent LiNbO3 (CLN)
Crystal Technology, Inc. (1999)
Pyroelectric coefficientS
−6.4×10−5C/(m2 K)
Composition not stated('crystals of different compositions'); T room temperature
Schwesyg, Universitat Bonn (2011), Eq. (2.17)
Residual absorption, as-grown crystalsP
up to 0.04 cm^-1 (transition-metal impurities, 400-2000 nm); about 0.001 cm^-1 H-related bands at 2300-2800 nm; annealing lowers absorption by up to 10xcm−1
Congruent LiNbO3 (CLN)(CLN and MgO5 crystals)
Schwesyg, Universitat Bonn (2011), abstract; Sec. 3.1, 3.3
Thermal conductivityV
≈ 4.2W/(m K)
Congruent LiNbO3 (CLN); T 25 °C
Crystal Technology, Inc. (1999)
UV transmission cutoffV
340nm
Congruent LiNbO3 (CLN); method 1/e transmission, 1 cm thick
Crystal Technology, Inc. (1999)
Photoelastic (strain-optic) coefficientsS
p11 −0.023, p12 0.076, p13 0.147, p14 0.057, p31 0.157, p33 0.141, p41 0.051, p44 0.126
Composition not stated; λ 633 nm; frame: unstated
Mys et al., Applied Optics 54, 8176 (2015) (2015)
Photoelastic (strain-optic) coefficientsS
p11 −0.026, p12 0.088, p13 0.134, p14 −0.083, p31 0.177, p33 0.07, p41 −0.151, p44 0.145
Composition not stated; λ 633 nm; frame: unstated
Rodrigues et al. (2023), Eq. 8

Status: P primary source read at the locator; P(abs) only the abstract read; P-comp read in a compilation that names the original measurement; original not read; P-db CC0 database transcription of a primary source; S secondary source quoting the original; V vendor datasheet; not traceable to a specific measurement; C computed from listed inputs. Unverified claims (39) are not in this table: /api/v1/unverified.json.

Properties

64 pages, each with Dataset JSON-LD and its endpoints
PropertySymbolKindRecordsVariantsJSON
Absorption coefficient in the transparent rangeαscalar1CLNproperties/absorption-coefficient.json
Activation energy of dark (protonic) conductivityscalar1CLNproperties/dark-conductivity-activation-energy.json
Birefringence ne - none - noscalar6CLN, MgO5properties/birefringence.json
Bulk longitudinal velocity along XvL,Xscalar1CLNproperties/bulk-velocity-longitudinal-x.json
Bulk longitudinal velocity along YvL,Yscalar1CLNproperties/bulk-velocity-longitudinal-y.json
Bulk longitudinal velocity along ZvL,Zscalar1CLNproperties/bulk-velocity-longitudinal-z.json
Bulk shear velocity along X (resonance)vS,Xscalar1CLNproperties/bulk-velocity-shear-x.json
Bulk shear velocity along YvS,Yscalar1CLNproperties/bulk-velocity-shear-y.json
Bulk shear velocity along ZvS,Zscalar1CLNproperties/bulk-velocity-shear-z.json
Coercive fieldEcscalar4CLN, MgO1-SLN, MgO5, SLNproperties/coercive-field.json
Coercive field ratio Ec(CLN)/Ec(SLN)scalar2CLNproperties/coercive-field-ratio-cln-sln.json
Congruent compositionscalar2CLNproperties/congruent-composition.json
Curie temperatureTCscalar6CLN, SLN, n/sproperties/curie-temperature.json
Curie temperature vs crystal composition (linear fit)scalar2n/sproperties/curie-temperature-vs-composition.json
Dark conductivityσdscalar1CLNproperties/dark-conductivity.json
Densityρscalar6CLN, SLN, n/sproperties/density.json
Elastic stiffness component c14 (constant E), LiTaO3 (comparison material)c14Escalar1LT SAWproperties/elastic-c14.json
Electro-optic coefficient r13, unclampedr13Tscalar1SLNproperties/eo-r13-T.json
Electro-optic coefficient r22, unclampedr22Tscalar1CLNproperties/eo-r22-T.json
Electro-optic coefficient r33, LiTaO3 (comparison material)r33scalar1LTproperties/eo-r33.json
Electro-optic coefficient r33, unclampedr33Tscalar1SLNproperties/eo-r33-T.json
Extraordinary refractive indexnescalar14CLN, LT, MgO5, SLNproperties/refractive-index-e.json
Hydrostatic piezoelectric coefficient dh = 2 d31 + d33dhscalar1n/sproperties/hydrostatic-piezo-dh.json
Internal fieldEintscalar3CLN, MgO5properties/internal-field.json
IR transmission cutoffscalar1CLNproperties/ir-cutoff.json
Lattice constant a (hexagonal setting)ascalar7CLN, SLN, n/sproperties/lattice-a.json
Lattice constant c (hexagonal setting)cscalar6CLN, SLN, n/sproperties/lattice-c.json
Maxwell relaxation time (dark)τMscalar1CLNproperties/maxwell-relaxation-time.json
Melting pointTmscalar3CLN, SLNproperties/melting-point.json
MgO concentration threshold for optical-damage resistancescalar1MgO5properties/mgo-photorefractive-threshold.json
Mohs hardnessscalar1CLNproperties/mohs-hardness.json
Nonlinear (Kerr) refractive indexn2scalar3n/sproperties/nonlinear-index-n2.json
OH stretch absorption bandscalar2CLN, MgO5properties/oh-stretch-band.json
Optical band gapEgscalar1n/sproperties/optical-band-gap.json
Ordinary refractive indexnoscalar14CLN, LT, MgO5, SLNproperties/refractive-index-o.json
Point group (ferroelectric phase)scalar1n/sproperties/point-group.json
Pyroelectric coefficientp3scalar3CLN, n/sproperties/pyroelectric-p3.json
Residual absorption, as-grown crystalsscalar1CLNproperties/residual-absorption.json
Rhombohedral cell angle ααRscalar2n/sproperties/rhombohedral-alpha.json
Rhombohedral cell edge aRaRscalar2n/sproperties/rhombohedral-a.json
Second-order nonlinear coefficient d31d31scalar2CLNproperties/nlo-d31.json
Space group (ferroelectric phase, below Tc)scalar1n/sproperties/space-group.json
Space group (paraelectric phase, above Tc)scalar1n/sproperties/space-group-paraelectric.json
Specific heat capacitycpscalar3CLN, SLNproperties/specific-heat.json
Spontaneous polarizationPsscalar2CLNproperties/spontaneous-polarization.json
Thermal conductivitykappascalar4CLN, SLN, n/sproperties/thermal-conductivity.json
Thermal expansion coefficient parallel to cα33scalar3CLN, SLNproperties/thermal-expansion-c.json
Thermal expansion coefficient perpendicular to cα11scalar3CLN, SLNproperties/thermal-expansion-a.json
Thermo-optic coefficient, extraordinarydne/dTscalar5CLNproperties/dne-dt.json
Thermo-optic coefficient, ordinarydno/dTscalar4CLNproperties/dno-dt.json
Transparency rangescalar2CLN, SLNproperties/transparency-range.json
UV absorption edge at α = 20 cm−1λ20scalar2CLN, SLNproperties/uv-edge-lambda20.json
UV absorption edge vs compositionscalar1n/sproperties/uv-edge-formula.json
UV transmission cutoffscalar1CLNproperties/uv-cutoff.json
Elastic compliance at constant electric fieldsEtensor3CLN, n/stensors/elastic-compliance-sE.json
Elastic stiffness at constant electric fieldcEtensor7CLN, n/stensors/elastic-stiffness-cE.json
Linear electro-optic (Pockels) coefficients, clamped (constant strain)rStensor3CLN, n/stensors/eo-rS.json
Linear electro-optic (Pockels) coefficients, unclamped (constant stress)rTtensor2CLNtensors/eo-rT.json
Photoelastic (strain-optic) coefficientsptensor5n/stensors/photoelastic-p.json
Piezoelectric strain constantsdtensor5CLN, n/stensors/piezo-strain-d.json
Piezoelectric stress constantsetensor6CLN, n/stensors/piezo-stress-e.json
Relative permittivity, constant strain (clamped)εS/ε0tensor7CLN, n/stensors/permittivity-S.json
Relative permittivity, constant stress (free)εT/ε0tensor7CLN, n/stensors/permittivity-T.json
Second-order nonlinear optical coefficientsd (SHG)tensor4CLN, SLN, n/stensors/nlo-d.json

Dispersion models and API

static JSON and CSV, no query strings