PPLN Λ = 6.82 µm · 1064 → 532 nm · 2 px/µm

3.1 Piezoelectricity

L1 Phenomenon

longitudinal response; Kushibiki et al. 1999 constants

Squeeze a lithium niobate crystal along certain directions and charge appears on its faces; apply a voltage and it changes shape. The effect needs a crystal without a center of symmetry; LN (point group 3m) qualifies. The response depends strongly on direction: pressing along the crystal Y axis gives a charge about 2.3 times larger than pressing along the polar Z axis (d22 = 20.3 vs d33 = 8.69 pC/N derived). One volt across a free crystal moves its faces by about 20 pm along Y.

Drag the press direction around the equator: the charge changes sign every 60°, the threefold axis seen directly. The largest response lies off every crystal axis, 29° below the basal plane.

Longitudinal response dL(n) = dijkninjnk

θ = 90°: XY plane, φ from +X

10203040XY

YZ plane (φ = 90°, 270°)

10203040YZ

3m, viewed down +Z

            +Y
             |
 `-.         |         .-'
    `-.      |      .-'
       `-.   |   .-'
          `-.|.-'
 -X ········ ▲ ········ +X
          .-'|`-.
       .-'   |   `-.
    .-'      |      `-.
 .-'         |         `-.
             |
pC/Nvaluestatus
d15+66.38derivedP-comp
d22+20.30derivedP-comp
d31 −1.04derivedP-comp
d33 +8.69derivedP-comp
d16 = −2d22−40.60derivedP-comp
090.0°
090.0°
dL(n)
+20.30 pC/N
+n face, 1 MPa squeeze
−20.30 µC/m²
free stroke per volt
+20.30 pm/V
|dL| max
−38.80 pC/N
max at θ = 118.9°, φ = 30° + k·120°. Solid: dL > 0; dashed: dL < 0; dotted lines and the Y axis: mirror-plane traces.
d = e sE from Kushibiki et al. 1999 e, cE, εS P derivedSmith & Welsh 1971 d via Weis & Gaylord 1985 Table 3 P-comp Frame IEEE-176-1987
dL > 0: the +n face turns negative when squeezeddL < 0: it turns positive

Squeeze along n, 1 MPa

+20.30pC/N
−+−+−+−+−+−+−+−+−+−+−+−+−+−+−+−+−+−+−+−+−+−+−+−++n face−n face
θ, φ
090.0° 090.0°
charge on the +n face
−20.30 µC/m²
free stroke per volt along n
+20.30 pm/V

Around the equator (θ = 90°): dL = −d22 sin 3φ

0°60°120°180°240°300°360°
090.0°
090.0°
View
Constants
d = e sE from Kushibiki et al. 1999 P derivedSmith & Welsh 1971 via Weis & Gaylord 1985 P-complargest |dL|: −38.80 pC/N at θ = 118.9°, φ = 30° + k·120°frame IEEE-176-1987

L2 Constitutive model

IEEE Std 176-1987; Kushibiki et al. 1999

Constitutive equations, stress-charge form, full tensor and compressed (Voigt) notation P:

Tp=cpqESq−ekpEk,Di=eiqSq+εikSEk(1)

IEEE 176 states that this pair (independent variables S, E) is the only form that yields the field equations of the unbounded continuum; the other three forms are exact but used where boundaries make some variables approximately zero.

FormIndependentEquationsCoefficient
stress-charge (e)S, ET = cES − etE; D = eS + εSEe (C/m²)
strain-charge (d)T, ES = sET + dtE; D = dT + εTEd (C/N = m/V)
strain-voltage (g)T, DS = sDT + gtD; E = −gT + βTDg (V m/N = m²/C)
stress-voltage (h)S, DT = cDS − htD; E = −hS + βSDh (V/m = N/C)

IEEE 176 Eqs. 37-42 P. Relations (Eq. 43): cEsE = 1, βSεS = 1, cD = cE + eth, εT = εS + d et, e = d cE, g = βTd, sD = sE − dtg, βT = βS − g ht, d = εTg, h = g cD.

3m form in the IEEE frame

e123456
10000e15−e22
2−e22e220e1500
3e31e31e33000

IEEE 176 Table 8, class 3m; Weis & Gaylord 1985 Eq. 8 P. d has the same pattern except d16 = −2d22 (factor 2 from the strain convention).

LN values (congruent, SAW grade)

QuantityValueUnitSourceStatus
e15, e22, e31, e333.655 ± 0.022, 2.407 ± 0.015, 0.328 ± 0.032, 1.894 ± 0.054C/m²Kushibiki et al. 1999 Table VP
e15, e22, e31, e33, RUS at 30 °C3.65 ± 0.03, 2.39 ± 0.03, 0.31 ± 0.04, 1.72 ± 0.18C/m²Ogi et al. 2002P
ε11T/ε0, ε33T/ε083.3 ± 0.8, 28.5 ± 0.31Kushibiki et al. 1999 Table IVP
ε11S/ε0, ε33S/ε044.9 ± 0.4, 26.7 ± 0.31Kushibiki et al. 1999 Table VP
εT recomputed from εS + d et83.34, 28.481Kushibiki et al. 1999 set; within 0.1% of the measured εTderived
d15, d22, d31, d3366.4, 20.3, −1.04, 8.69 (d16 = −40.6)pC/Nd = e sE, Kushibiki et al. 1999 constantsderived
d15, d22, d31, d33 (Smith and Welsh 1971)69.2, 20.8, −0.85, 6.0pC/NWeis & Gaylord 1985 Table 3P-comp
d15, d22, d31, d33 (Warner et al. 1967)68, 21, −1.0, 6pC/NWeis & Gaylord 1985 Table 3P-comp
d33 (Yamada et al. 1967)16pC/NWeis & Gaylord 1985 Table 3P-comp
hydrostatic dh = 2d31 + d33, measured6.31 ± 0.014pC/NGraham 1976 via Weis & Gaylord 1985 p. 198P-comp
dh from the Kushibiki et al. 1999 set6.62pC/N+4.9% vs measuredderived
g15, g22, g330.0900, 0.0275, 0.0345V m/Ng = βTdderived
h15, h22, h339.19, 6.05, 8.01109 V/mh = βSederived
c33D, c44D249.35, 93.45GPacD = cE + ethderived

d33 is the least certain coefficient: tabulated values span 6 to 16 pC/N, and the measured hydrostatic coefficient dh = 6.31 pC/N implies d33 of about 8.0 to 8.4 pC/N given d31 of −0.85 to −1.04 pC/N, which rules out 12.5 to 16 (derived from the Graham 1976 and compiled d31 values derived).

Longitudinal response along a unit vector n (polar angle θ from +Z, azimuth φ from +X), from the 3m d tensor:

dL(n)=dijkninjnk=d33cos3θ+(d31+d15)cosθsin2θ−d22sin3θsin3φ(2)

dL(+Y) = +d22 and dL(+Z) = +d33. The sin 3φ term is the threefold axis made visible: in the XY plane the response alternates sign every 60°.

Coupling factors

IEEE 176 defines quasistatic material coupling factors from energy ratios, e.g. k332 = d332/(s33Eε33T) = (s33E − s33D)/s33E, and thickness-mode factors kt = e33/(c33Dε33S)1/2, k15 = e15/(c55Dε11S)1/2 (Eqs. 124-125, Table 10 P). For the Kushibiki et al. 1999 set:

FactorValueStatus
kt, thickness extensional, Z-cut plate0.247 (kt2 = 0.061)derived
k15, thickness shear0.600 (k152 = 0.360)derived
k33, rod along Z0.243derived
k31−0.027derived
longitudinal along Y, d22/(s22Eε22T)1/20.309derived

For a Y-cut plate no single thickness coupling factor exists for class 3m, because two stiffened waves couple at the electrodes (IEEE 176 Sec. 4.3, Eqs. 64-65 P).

Pick a matrix below; click a cell to see which full-tensor components it stands for. s66 stands for four components, each one quarter of the Voigt value; c66 for the same four with no factor.

Constitutive constants, Kushibiki et al. 1999 set, all four forms
Matrix

d in C/N; click a cell

123456
1....+6.638e−11−4.060e−11
2−2.030e−11+2.030e−11.+6.638e−11..
3−1.037e−12−1.037e−12+8.690e−12...

selected Voigt cell

cell
d16
Voigt value
−4.0596e−11 C/N
factor
×2
each component
−2.0298e−11 C/N
components
d112 = d121
symmetry
d16 = −2d22
cEsE = 1 · d = e sE · εT = εS + d et · g = βTd · h = βSe · cD = cE + eth · sD = sE − dtg. Factors: s carries 1, 2, 4; d and g carry 2 on shear columns; c, e, h, ε none.
Kushibiki et al. 1999 cE, e, εS P converted with IEEE 176 Eq. 43 derived frame IEEE-176-1987

d: square area ∝ |value|, tone = sign; tap a cell

123456123

The Voigt cell as full-tensor components

d16= 2 × component
111213212223313233123
Voigt value
−4.060e−11 C/N
each lit component
−2.030e−11 C/N
symmetry
d16 = −2d22
Matrix
Labels

Free permittivity: measured vs εS + d et

020406080100ε₁₁ᵀ/ε₀83.34 computed, 83.3 ± 0.8 measuredε₃₃ᵀ/ε₀28.48 computed, 28.5 ± 0.3 measured
Kushibiki et al. 1999 cE, e, εS, εT measured Pconverted with IEEE 176 Eq. 43 derivedframe IEEE-176-1987

L3 Conventions, frames, error sources

IEEE 176 Eqs. 22, 25, 44-45; Weis & Gaylord 1985

Convention of 2s

Compressing symmetric index pairs into Voigt indices (1 = xx, 2 = yy, 3 = zz, 4 = yz, 5 = xz, 6 = xy) puts factors on some quantities and not others P:

QuantityVoigt ruleFactor
stress Tp, stiffness cpq, piezo eip, photoelastic ppq (strain-optic), EO rpkTp = Tij; cpq = cijkl; eip = eiklnone
strain SpSp = Sij for p = 1..3; Sp = 2Sij for p = 4..62 on shear
compliance spqsijkl; 2sijkl if one of p, q in 4..6; 4sijkl if both1, 2, 4
piezo diq (and giq)dikl for q = 1..3; 2dikl for q = 4..62 on shear
piezo-optic πpq (stress-optic)as s1, 2, 4 (hence π66 = 2(π11 − π12) in Nye's convention)

Numerical checks: c66 = (c11 − c12)/2 but s66 = 2(s11 − s12); e16 = −e22 but d16 = −2d22; c56 = c14 but s56 = 2s14; p66 = (p11 − p12)/2 (Weis & Gaylord 1985 Eqs. 16-17, 19 P). Software that stores tensors in Voigt form must state the convention. Full-rank tensors: /api/v1/tensors.json.

Sign frame

+Z is the end that becomes negative on compression (equivalently, positive on cooling); IEEE 1987, IRE 1949 (via Weis & Gaylord 1985 pp. 192-193) and IRE 1958 (via Volk & Wöhlecke 2008 p. 2) give the same +Z and +Y for LN (P P-comp P-comp). IEEE 176 states a 180° rotation about Z between its 1987 and 1949 axes for quartz (class 32) only. A 180° rotation about Z flips c14, s14, e22, d22, p14, p41 and r22 together; once d22 > 0 is imposed, no sign freedom remains, and c14 > 0 follows derived. Flipping +Z (180° about X) flips every odd-rank tensor (e, d, r, χ(2), pyroelectric p3) but not c or p.

Clamped vs free

εT (free, below mechanical resonances) and εS (clamped, above them) differ by almost a factor 2 for ε11 (83.3 vs 44.9 P), because d15 and e15 are large. The same mechanism makes rT − rS = p d large for r22 and r51 (Weis & Gaylord 1985 Eq. 13 P); see 2.2.

Isothermal vs adiabatic

IEEE 176 makes no notational distinction; adiabatic constants apply under rapidly varying conditions (IEEE 176 p. 7, text after Eq. 21 P).

Data spread

ε33S spans 23.7 (Yamada et al. 1967) to 29 (Savage 1966), both via Weis & Gaylord 1985 Table 1 P-comp, and ε11T 83.3 (Kushibiki et al. 1999 P) to 85.2 (Warner et al. 1967, via Weis & Gaylord 1985 P-comp). Values from different sets are shown as a spread, not blended.

Measurement

Kushibiki et al. 1999 obtained cE, e and εS by fitting bulk-wave velocities measured on X-, Y- and Z-cut plates together with εT and density (Table II velocities, Tables IV-V constants P). Ogi et al. 2002 used resonant ultrasound spectroscopy at 30 °C P. Rotating these constants to other axes: rotate full-rank tensors (cijkl, eijk, εij); the Bond 6×6 matrices (Bond 1943) are equivalent for Voigt storage, and IEEE 176 warns that compressed notation hides transformation properties.

References

3.1
SourceReferenceLink
IEEE 1988IEEE, IEEE (1988). IEEE Standard on Piezoelectricity (IEEE Std 176-1987)doi:10.1109/IEEESTD.1988.79638
Kushibiki et al. 1999Kushibiki et al., IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control 46 1315-1323 (1999). Accurate measurements of the acoustical physical constants of LiNbO3 and LiTaO3 single crystalsdoi:10.1109/58.796136
Ogi et al. 2002Ogi et al., Journal of Applied Physics 92 2451-2456 (2002). Acoustic spectroscopy of lithium niobate: Elastic and piezoelectric coefficientsdoi:10.1063/1.1497702
Weis & Gaylord 1985Weis & Gaylord, Applied Physics A Solids and Surfaces 37 191-203 (1985). Lithium niobate: Summary of physical properties and crystal structuredoi:10.1007/BF00614817
Smith & Welsh 1971Smith & Welsh, Journal of Applied Physics 42 2219-2230 (1971). Temperature Dependence of the Elastic, Piezoelectric, and Dielectric Constants of Lithium Tantalate and Lithium Niobatedoi:10.1063/1.1660528
Warner et al. 1967Warner, Onoe & Coquin, The Journal of the Acoustical Society of America 42 1223-1231 (1967). Determination of Elastic and Piezoelectric Constants for Crystals in Class (3m)doi:10.1121/1.1910709
Graham 1976Graham, Ferroelectrics 10 65-69 (1976). Pressure dependence of the piezoelectric polarization of LiNbO3 and LiTaO3doi:10.1080/00150197608241952
Volk & Wohlecke 2009Volk & Wohlecke, Springer Series in Materials Science (2009). Lithium Niobate: Defects, Photorefraction and Ferroelectric Switchingdoi:10.1007/978-3-540-70766-0
Bond 1943Bond, Bell System Technical Journal 22 1-72 (1943). The Mathematics of the Physical Properties of Crystalsdoi:10.1002/j.1538-7305.1943.tb01304.x